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In Reply to: RE: Resistor noise on AUDIO applications posted by fmak on November 30, 2010 at 02:02:08:
In my last job, I was responsible for parametric test in a wafer fabrication facility.
One test, a simple breakdown measurement, gave inconsistent results on some wafer designs only.
I studied the parametric test probers and discovered a funky ground connection to the wafer chuck. The prober designers had followed good star grounding practice in most of the machine, but had lapsed on this one connection. The design engineer for the test structure layout on the affected wafer designs had neglected to place adequate substrate ties around the problematic structure. The net result was false flags of below-normal breakdown voltages on perfectly good wafers.
The world is full of half-assed designs created by 'scientific' engineers.
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Follow Ups
- Using an audiophile approach to solve industrial problems. - Al Sekela 10:45:53 12/01/10 (1)
- RE: Using an audiophile approach to solve industrial problems. - rick_m 07:56:00 12/03/10 (0)
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